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Chalcogenide hybrid inorganic/organic polymers (CHIPs) are a new class of optical polymeric materials for imaging and photonic applications due to their high refractive indices and high optical transmission at visible and infrared wavelengths. In this study, we characterize these polymers to study the refractive index and delve into the electronic properties by way of measurements of their dielectric constants. Ellipsometry is used to determine the refractive indices for wavelengths from 500 nm to 12 µm, while we use capacitance measurements on thin film capacitors with a range of areas to find the dielectric constant. The results are in line with expectations based on the sulfur composition of the polymers-indices range from 1.7 to 1.85, and dielectric constants range from 2.6 to 3. With these measurements, these sulfur polymer materials are established to be good candidates for optical and photonic applications, particularly with respect to telecommunications. The dielectric constants suggest that applications such as electro-optic devices and capacitors may also be viable.